Prof. Hongxia Liu | Wide Bandgap Semiconductors | Research Excellence Award
Supervisor | Xidian unniversity | China
Hongxia Liu is a Professor of Microelectronics at Xidian University, specializing in advanced semiconductor device engineering. She holds bachelor’s, master’s, and doctoral degrees in microelectronics from North West University, Xi’an Jiaotong University, and Xidian University, respectively. Her professional career encompasses academic leadership, supervision of competitive research projects, and mentorship of graduate researchers in microelectronics and integrated circuit technologies. Her research focuses on advanced CMOS device design, device physics, and the reliability of wide bandgap semiconductor materials, with contributions published extensively in leading international journals. Professor Liu’s work has significantly advanced semiconductor device performance and reliability, and her standing is further demonstrated through academic recognitions, editorial and peer-review service, and active membership in the global microelectronics research community. Her scholarly impact is reflected in 2,912 citations across 431 publications, with an h-index of 23.
Citation Metrics (Scopus)
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2912
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431
h-index
23
Citations
Documents
h-index
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Featured Publications
A Compact SCR Structure with Reduced Trigger Voltage and Parasitic Capacitance for High-Speed I/O ESD Protection
– Microelectronics Journal, 2026 (Open Access)
– Microelectronics Journal, 2026 (Open Access)
Performance Analysis and Optimization of an InGaAs/GaAsSb Heterojunction Dopingless Tunnel FET with a Heterogate Dielectric
– Micromachines, 2025 (Open Access)
– Micromachines, 2025 (Open Access)
Investigation of Thermal Accumulation and Lifetime in AlGaN-Based UV-C LEDs Degradation under Current Stress
– Journal of Materials Science: Materials in Electronics, 2025
– Journal of Materials Science: Materials in Electronics, 2025
Preparation and Performance Exploration of MoS₂/WSe₂ Van der Waals Heterojunction Tunneling Field-Effect Transistor
– Micromachines, 2025 (Open Access)
– Micromachines, 2025 (Open Access)
Degradation and Damage Effects in GaN HEMTs Induced by Low-Duty-Cycle High-Power Microwave Pulses
– Micromachines, 2025 (Open Access, 1 citation)
– Micromachines, 2025 (Open Access, 1 citation)